Wideband matching circuit and method of effectuating same

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Details

C702S057000, C702S065000, C702S189000, C340S315000, C333S017300, C379S027010, C375S257000

Reexamination Certificate

active

07376535

ABSTRACT:
A method is provided for determining an optimal performance of a lossless circuit. In one embodiment, the number of inductors and capacitors contained in a circuit of interest are input, and then a random search of a plurality of lossless circuits, each having the same number of inductors and capacitors, is conducted. Then, the electrical load used by the circuit of interest is input into each of the plurality of lossless circuits. The method then searches for a circuit of the plurality of lossless circuits having the smallest mismatch between the electrical load and the circuit's input reflectance. The circuit having a lowest mismatch between the input electrical load and the circuit's input reflectance is then determined.

REFERENCES:
patent: 4233608 (1980-11-01), Moran et al.
patent: 4434397 (1984-02-01), Nelson
patent: RE39051 (2006-03-01), Harnett
patent: 7034629 (2006-04-01), Tsironis
patent: 2002/0175878 (2002-11-01), Toncich
patent: 2004/0091053 (2004-05-01), Bargroff

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