wideband gap power semiconductor device having a low...

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

11191218

ABSTRACT:
A power semiconductor device includes a first semiconductor layer, a second semiconductor layer of a first conductivity type, first and second main electrodes, a control electrode and a third semi-conductor layer. The second semiconductor layer is formed on the first semiconductor layer. The first and second main electrodes are formed on the second semiconductor layer separately from each other. The control electrode is formed on the second semiconductor layer between the first and second main electrodes. The third semiconductor layer is formed on the second semiconductor layer between the control electrode and the second main electrode.

REFERENCES:
patent: 5399886 (1995-03-01), Hasegawa
patent: 5442205 (1995-08-01), Brasen et al.
patent: 5905277 (1999-05-01), Ota et al.
patent: 6064082 (2000-05-01), Kawai et al.
patent: 6483135 (2002-11-01), Mizuta et al.
patent: 6548333 (2003-04-01), Smith
patent: 6555851 (2003-04-01), Morizuka
patent: 6593597 (2003-07-01), Sheu
patent: 6639255 (2003-10-01), Inoue et al.
patent: 6696306 (2004-02-01), Makita
patent: 6858509 (2005-02-01), Delage et al.
patent: 7030428 (2006-04-01), Saxler
patent: 2001/0015437 (2001-08-01), Ishii et al.
patent: 2005/0062069 (2005-03-01), Saito et al.
patent: 2005/0110042 (2005-05-01), Saito et al.
patent: 2001-230407 (2001-08-01), None
N.-Q. Zhang, et al., IEEE Electron Device Letters, vol. 21, No. 9, pp. 421-423, “High Breakdown GaN Hemt with Overlapping Gate Structure”, Sep. 2000.
S. Karmalkar, et al., IEEE Electron Device Letters, vol. 22, No. 8, pp. 373-375, “Resurf AlGaN/GaN Hemt for High Voltage Power Switching”, Aug. 2001.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

wideband gap power semiconductor device having a low... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with wideband gap power semiconductor device having a low..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and wideband gap power semiconductor device having a low... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3810553

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.