Wideband frequency domain reflectometry to determine the...

Multiplex communications – Diagnostic testing – Path check

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C370S242000, C709S241000, C709S241000

Reexamination Certificate

active

07385932

ABSTRACT:
A technique for estimating distances and the nature of irregularities and faults on a telephone subscriber line is disclosed. Reflected test signals are measured as a function of frequency. The measurements are compensated for variable propagation velocity and variable line attenuation and then weighted before transformation with the Fourier transform. The amplitude and phase of peaks in the spectral domain identify the distances to the irregularities and the magnitude and phase angle of the reflection coefficients.

REFERENCES:
patent: 3751606 (1973-08-01), Kaiser, Jr.
patent: 3904839 (1975-09-01), Peoples
patent: 4218656 (1980-08-01), Lazarus
patent: 5825846 (1998-10-01), Aach et al.
patent: 6327534 (2001-12-01), Levanon et al.
patent: 6466649 (2002-10-01), Walance et al.
patent: 6668041 (2003-12-01), Kamali et al.
patent: 6724344 (2004-04-01), Stockmaster et al.
patent: 2002/0146095 (2002-10-01), Peoples
patent: 2004/0062361 (2004-04-01), Kamali et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Wideband frequency domain reflectometry to determine the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wideband frequency domain reflectometry to determine the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wideband frequency domain reflectometry to determine the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2806975

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.