Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-17
2007-04-17
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C342S194000, C342S013000
Reexamination Certificate
active
11170121
ABSTRACT:
An IFM receiver includes a hybrid for outputting I and Q signals from a received input signal; a first ADC for digitizing the I signal to produce a first digital signal at a sampling rate of 1/τ, and a second ADC for digitizing the Q signal to produce a second digital signal at the same sampling rate. A processor is configured to (a) delay the first and second digital signals by at least one sample time of τ, (b) count the number of samples produced having predetermined phase shifts, and (c) determine the frequency of the received input signal, based on the number of samples having the predetermined phase shifts. The first and second ADCs are each 1-bit analog-to-digital converters. The predetermined phase shifts of 0°, 90°, −90° and 180° are counted by the processor over a predetermined time interval.
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Lopata Stuart Mitchell
Tsui James B. Y.
Ward Charles Richard
Barlow John
ITT Manufacturing Enterprises Inc.
RatnerPrestia
Sievers Lisa
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