Wideband device modeling method

Details Wideband device modeling method Wideband device modeling method

2007-09-11

2007-09-11

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S076110, C702S057000

Reexamination Certificate

active

10736576

ABSTRACT:
A wideband device modeling method comprises using ultra-short time-domain impulse responses measurement and using a subsequent extraction of said ultra-short time-domain impulse responses measurement. The wideband device modeling method in the invention is to provide a model that could faithfully describe an ultra-short TD response and would conform to the wideband consideration. An ultra-short impulse with tens of pico-second width has been used in this work for characterizing the TD responses of the devices. Moreover, the wideband device modeling method in the invention is to provide a layer peeling technique, widely used in characterizing PCB interconnection or package, is mixed with a conventional spiral inductor physical model. The wideband device modeling method in the invention also provides an extension equivalent circuit combined with the BSIM3v3 model.

REFERENCES:
patent: 6775901 (2004-08-01), Lee et al.
patent: 2004/0064296 (2004-04-01), Saxena et al.

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