Wide write head with thermal asperity detector and method of...

Dynamic magnetic information storage or retrieval – Checking record characteristics or modifying recording...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C360S031000

Reexamination Certificate

active

06940669

ABSTRACT:
A system for detecting thermal asperities and magnetic defects on a disc. The system includes a wide write head and a certification head. The wide write head includes a thermal asperity detector and a write element. A method for detecting thermal asperities and magnetic defects comprising writing a track with the wide write head, reading defects with the certification head, and scanning for thermal asperities with the thermal asperity detector. A burst pattern can be written to the disc upon locating a asperity of defect.

REFERENCES:
patent: 4459248 (1984-07-01), Sagawa et al.
patent: 5115358 (1992-05-01), Widney
patent: 5122917 (1992-06-01), Spainger
patent: 5233482 (1993-08-01), Galbraith et al.
patent: 5333140 (1994-07-01), Moraru et al.
patent: 5423111 (1995-06-01), Mori
patent: 5527110 (1996-06-01), Abraham et al.
patent: 5790332 (1998-08-01), Bucska
patent: 5901001 (1999-05-01), Meyer et al.
patent: 5909344 (1999-06-01), Gill
patent: 6046837 (2000-04-01), Yamamoto
patent: 6071007 (2000-06-01), Schaenzer et al.
patent: 6104556 (2000-08-01), Schaenzer
patent: 6154335 (2000-11-01), Smith et al.
patent: 6216242 (2001-04-01), Schaenzer
patent: 6292316 (2001-09-01), Dietzel et al.
patent: 6335840 (2002-01-01), Malone
patent: 6421193 (2002-07-01), Li
patent: 6519715 (2003-02-01), Takashi et al.
patent: 6578164 (2003-06-01), Stokes et al.
patent: 6628465 (2003-09-01), Yong
patent: WO 01/22410 (2001-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Wide write head with thermal asperity detector and method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wide write head with thermal asperity detector and method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wide write head with thermal asperity detector and method of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3402621

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.