Wide-width micrometer and method of using the same

Details Wide-width micrometer and method of using the same Wide-width micrometer and method of using the same

1994-03-30

1995-11-07

Cuchlinski, Jr., William A.

Geometrical instruments

Distance measuring

Opposed contacts

33831, 33549, 33555, G01B 318

Patent

active

054638186

ABSTRACT:
A device for measuring a dimension of an object includes a platform with a contact surface and a measuring device. An object to be measured is placed on the platform between the contact surface and the measuring device and held flat by a clamping wedge. In order to obtain a variance of said dimension with respect to a nominal value, a standard having a known length is first placed on the platform and the measuring device is calibrated using the standard.

REFERENCES:
patent: 1335004 (1920-03-01), Lehigh
patent: 1829323 (1931-10-01), Witter et al.
patent: 3142121 (1964-07-01), Stefanov
patent: 4103427 (1978-08-01), Ledley, III
patent: 4160326 (1979-07-01), Griesbach
patent: 4972603 (1990-11-01), Meyer
patent: 5287631 (1994-02-01), Stade

Affiliated with

Also associated with

Rating

Wide-width micrometer and method of using the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wide-width micrometer and method of using the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wide-width micrometer and method of using the same will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-190736