Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1991-04-24
1992-12-15
Harvey, Jack B.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324149, G01R 3102, G01R 106
Patent
active
051720515
ABSTRACT:
A passive test probe apparatus 100 which provides high impedance and a relatively flat frequency response over a wide bandwidth. The probe apparatus 100 uses standard, non-lossy coaxial cable 130. The probe apparatus 100 employs a low capacitance probe tip 102 designed to minimize stray probe tip capacitance. The probe apparatus 100 uses a front-end (tip) resistor R.sub.t in series with a conventional RC tip network 240. The tip resistor R.sub.t provides two functions: First, it establishes a minimum input impedance for the probe input, and secondly, it provides approximately 80% of the high frequency attenuation when working into the cable characteristic impedance. In addition, a technique is described for determining an optimum length of coaxial cable 130 to be used in the probe apparatus 100. When the cable length is selected in accordance with the present invention, the crossover dip and other transmission line signal distortion effects are minimized.
REFERENCES:
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Nanosecond Passive Voltage Probes McGovern Mar. 1977 IEEE Transactions.
High Voltage Probe System Sarjeant et al. Oct. 1976 Review of Scientific Instruments.
Harvey Jack B.
Hewlett--Packard Company
Regan Maura K.
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