Wide angular range X-ray diffraction reference standard composit

Details Wide angular range X-ray diffraction reference standard composit Wide angular range X-ray diffraction reference standard composit

1982-05-26

1983-05-24

Ives, P.

Stock material or miscellaneous articles

Composite

Of silicon containing

428451, 428699, 428913, 4274198, 427160, 2502521, 378207, B32B 904

Patent

active

043850952

ABSTRACT:
A unique composite structure is provided for calibration of diffractometer at low values of 2.theta.. This composite structure involves a layer of silicon powder and a plurality of monolayers of a heavy metal stearate on the silicon powder. A lead stearate layered material has been found to provide significant results for enabling calibration below 20.degree..

REFERENCES:
patent: 2857291 (1958-10-01), Oksim
patent: 2864725 (1958-12-01), Sorg et al.

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