Geometrical instruments – Area integrators – Electrical
Patent
1987-07-28
1988-10-11
Cuchlinski, Jr., William A.
Geometrical instruments
Area integrators
Electrical
G01B 518
Patent
active
047760990
ABSTRACT:
An apparatus for use in the measurement of the thickness of a wet coating applied to a supporting surface includes a measuring disk having a support axis, a circumferential edge, the radial distance between the support axis and the circumferential edge varying at points along at least a portion of the edge, and indicia indicative of a coating thickness around that portion of the circumference. A disk support member supports the disk in a plane which is substantially perpendicular to the surface of the coating and permits rotation of the disk about the support axis within the plane so as to permit a measurement of the thickness of the coating to be made. The disk support member includes at least one support leg adapted to penetrate the coating and rest on the supporting surface to position the disk in the substantially perpendicular orientation with respect to the coating surface and to maintain the disk in the orientation while a measurement is made. A grip is provided for permitting gripping of the apparatus while a measurement is being made. A method of measuring the thickness of a wet coating applied to a supporting surface is also disclosed.
REFERENCES:
patent: 2167652 (1939-08-01), Hoch
patent: 2507592 (1950-05-01), Euverard
patent: 2675623 (1954-04-01), Lewis et al.
patent: 3128558 (1964-04-01), Euverard
patent: 3423837 (1969-01-01), Euverard
patent: 4169319 (1979-10-01), Gardner
patent: 4377037 (1983-03-01), Taylor
Maynard R. Euverard, Thickness Measurement.
Cuchlinski Jr. William A.
Paul N. Gardner Company, Inc.
Scanlon Patrick R.
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