Wet film thickness gauge

Geometrical instruments – Distance measuring – Single contact with a work engaging support

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Details

33832, G01B 502

Patent

active

053276590

ABSTRACT:
In order to achieve relative simplicity in a reliable measurement technique, an apparatus and method for measuring wet film thickness on a surface is disclosed. The apparatus includes a fixture adapted to be positioned in close proximity to the surface, a gauge supported by the fixture for movement toward and away from the surface, and a spacer for spacing the fixture at a selected distance from the surface. The gauge is moveable from a first position out of contact with the wet film to a second position in contact with the surface to create a measurable spot of the wet film on the gauge. The method includes providing a gauge supported for movement toward and away from the surface, moving the gauge into contact with the surface to create a measurable wet film spot, and moving the gauge out of contact with the wet film to measure the spot. When this has been achieved, the method includes the further step of taking a measurement of the wet film spot and converting the measurement to a wet film thickness, preferably by utilizing a calibration graph that has been created by utilizing a test plate having a tapered channel of known depth.

REFERENCES:
patent: 2507592 (1950-05-01), Euverard
patent: 3019645 (1962-02-01), Lake
patent: 3128558 (1964-04-01), Euverard
patent: 3758957 (1973-09-01), Eskijian
patent: 4169319 (1979-10-01), Gardner
patent: 4235018 (1980-11-01), Saberg
patent: 4377037 (1983-03-01), Taylor
patent: 4776099 (1988-10-01), Euverard
patent: 5094009 (1992-03-01), Koch et al.
patent: 5235756 (1993-08-01), Wickenhaver

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