Fishing – trapping – and vermin destroying
Patent
1985-07-22
1987-12-15
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437 20, 437 27, 437 28, 437 30, 437 34, 437 56, 437933, 357 42, 357 90, H01L 754, H01L 21265
Patent
active
047133295
ABSTRACT:
A method of forming CMOS transistors with self-aligned field regions. First and second spaced apart areas are provided on a silicon substrate. A masking member is formed protecting the first of said areas and exposing the second. The exposed area is doped with a p-type material which is driven in to form a p-well. The same region is again doped with additional p-type material after which the CMOS transistors are fabricated.
REFERENCES:
patent: 3876472 (1975-04-01), Polinsky
patent: 3983620 (1976-10-01), Spadea
patent: 4013484 (1977-03-01), Boleky et al.
patent: 4043025 (1977-08-01), Spadea
patent: 4045259 (1977-08-01), Sanders
patent: 4047284 (1977-09-01), Spadea
patent: 4131907 (1978-12-01), Ouyang
patent: 4135955 (1979-01-01), Gasner et al.
patent: 4143388 (1979-03-01), Esaki et al.
patent: 4152717 (1979-05-01), Satou et al.
patent: 4183134 (1980-01-01), Oehler et al.
patent: 4282648 (1981-08-01), Yu et al.
patent: 4295266 (1981-10-01), Hsu
patent: 4306916 (1981-12-01), Wollesen et al.
patent: 4314857 (1982-02-01), Aitken
patent: 4335504 (1982-06-01), Lee
patent: 4372033 (1983-02-01), Chiao
patent: 4373253 (1983-02-01), Khadder et al.
patent: 4376336 (1983-03-01), Endo et al.
patent: 4382827 (1983-05-01), Romano-Moran et al.
patent: 4385947 (1983-05-01), Halfacre et al.
patent: 4391650 (1983-07-01), Pfeifer et al.
patent: 4409726 (1983-10-01), Shiota
patent: 4412375 (1983-11-01), Matthews
patent: 4420872 (1983-12-01), Solo de Zaldivar
patent: 4517731 (1985-05-01), Khan et al.
patent: 4567640 (1986-02-01), Fang et al.
Fang Robert
Farb Joseph
Hsu Chung
Liang Victor
Wang Jerry
Data General Corporation
Hearn Brian E.
Huang Chi Tso
Wittenberg Malcolm B.
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