Well-aligned, high aspect-ratio, high-density silicon...

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is

Reexamination Certificate

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C257S003000, C257S012000, C257S021000, C257S022000, C257S028000, C257SE29082, C257SE29090, C257SE29168, C257SE29322, C257SE51040, C438S022000, C438S478000, C438S753000, C438S930000, C438S962000, C977S762000, C977S768000, C977S789000

Reexamination Certificate

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08044379

ABSTRACT:
A method of producing silicon nanowires includes providing a substrate in the form of a doped material; formulating an etching solution; and applying an appropriate current density for an appropriate length of time. Related structures and devices composed at least in part from silicon nanowires are also described.

REFERENCES:
patent: 5077143 (1991-12-01), Barraclough et al.
patent: 5348618 (1994-09-01), Canham et al.
patent: 5358600 (1994-10-01), Canham et al.
patent: 5458735 (1995-10-01), Richter et al.
patent: 5552328 (1996-09-01), Orlowski et al.
patent: 5561304 (1996-10-01), Canham et al.
patent: 5612255 (1997-03-01), Chapple-Sokol et al.
patent: 5627382 (1997-05-01), Canham et al.
patent: 5767020 (1998-06-01), Sakaguchi et al.
patent: 5914183 (1999-06-01), Canham
patent: 5920078 (1999-07-01), Frey
patent: 5976957 (1999-11-01), Westwater et al.
patent: 6147359 (2000-11-01), Canham et al.
patent: 6171512 (2001-01-01), Sakaguchi et al.
patent: 6238586 (2001-05-01), Sakaguchi et al.
patent: 6254794 (2001-07-01), Sakaguchi et al.
patent: 6313015 (2001-11-01), Lee et al.
patent: 6322895 (2001-11-01), Canham
patent: 6369405 (2002-04-01), Canham et al.
patent: 6380550 (2002-04-01), Canham et al.
patent: 6864190 (2005-03-01), Han et al.
patent: 7426025 (2008-09-01), Wang
patent: 2002/0088969 (2002-07-01), Lee et al.
patent: 2002/0172820 (2002-11-01), Majumdar et al.
patent: 2003/0135971 (2003-07-01), Liberman et al.
patent: 2004/0106218 (2004-06-01), Wang et al.
patent: 2004/0118698 (2004-06-01), Lu et al.
patent: 2005/0164432 (2005-07-01), Lieber et al.
patent: 2005/0253138 (2005-11-01), Choi et al.
patent: 2006/0019472 (2006-01-01), Pan et al.
patent: 2006/0154128 (2006-07-01), Kim et al.
patent: 2006/0188774 (2006-08-01), Niu et al.
patent: 1805160 (2006-07-01), None
patent: 101107737 (2008-01-01), None
patent: WO 91/09420 (1991-06-01), None
patent: WO 03/077298 (2003-08-01), None
English translation of Second Office Action issued Apr. 6, 2011 in corresponding Japanese Application No. 2007-800373753.
Ball, “Let There be Light” Nature, 2001, vol. 409, pp. 974-976.
Canham, “Silicon Quantum Wire Array Fabrication by Electrochemical and Chemical Dissolution of Wafers” Appl. Phys. Lett., 1990, vol. 57, No. 10, pp. 1046-1048.
Canham et al., “Progress Towards Silicon Optoelectronics Using Porous Silicon Technology” Applied Surface Science, 1996, vol. 102, pp. 436-441.
Canham, “Properties of Porous Silicon” L.T. (Ed.), Chapter 12. Application Areas, INSPEC, London, UK, (1997), pp. 341-399.
Cullis et al., “Visible Light Emission due to Quantum Size Effects in Highly Porous Crystalline Silicon” Letters to Nature, 1991, vol. 353, pp. 335-338.
Edit, “Investigation of Pristine and Oxidized Porous Silicon” Oulu University Press, Oulu 2005, pp. 1-59.
Fan et al., “Nanocarpet Effect: Pattern Formation During the Wetting of Vertically Aligned Nanorod Arrays” Nano Letters, 2004, vol. 4, No. 11, pp. 2133-2138.
Fan et al., “Fabrication of Silica Nanotube Arrays form Vertical Silicon Nanowire Templates” J. American Chemical Society, 2003, vol. 125, pp. 5254-5255.
Haq et al., “Nanopatterned Topography for Supporting Neurite Growth” Department of Biological and Agricultural Engineering, 1 page.
He et al., “Dispersion, Refinement, and Manipulation of Single Silicon Nanowires” Applied Physics Letters, 2002, vol. 80, No. 10, pp. 1812-1814.
Holmes et al., “Control of Thickness and Orientation of Solution-Grown Silicon Nanowires” Science, 2000, vol. 287, pp. 1471-1473.
Lehmann, V., Chapter 10. Applications, in “Electrochemistry of Silicon”:Instrumentation, Science, Materials and Applications, Wiley-VCH, (2002), pp. 207-241.
Marsen et al., “Fullerene-Structured Nanowires of Silicon” Physical Review B, 1999-II, vol. 60, No. 16, pp. 11 593-11 600.
Morales et al., “A Laser Ablation Method for the Synthesis of Crystalline Semiconductor Nanowires” Science, 1998, vol. 279, pp. 208-211.
Peng et al., “Fabrication of Single-Crystalline Silicon Nanowires by Scratching a Silicon Surface with Catalytic Metal Particles” Adv. Funct. Mater., 2006, vol. 16, pp. 387-394.
Rios, “Nanostructured Silicon Wires up Controlled Delivery” Pharmaceutical Technology, 2004, pp. 18-19.
Shi et al., “Synthesis of Large Areas of Highly Oriented Very Long Silicon Nanowires” Advanced Materials, 2000, vol. 12, No. 18, pp. 1343-1345.
Smith et al., “Porous Silicon Formation Mechanisms” J. Appl. Phys. 1992, vol. 71, No. 8, pp. R1-R22.
Suhr et al., “Damping Properties of Epoxy Films with Nanoscale Fillers” Journal of intelligent Material Systems and Structures, 2006, vol. 17, pp. 255-259.
Sunkara et al., “Bulk Synthesis of Silicon Nanowires Using a Low-Temperature Vapor-liquid-solid Method” Applied Physics Letters, 2001, vol. 79, No. 10, pp. 1546-1548.
Wong et al., “Low Temperature Syntheses of Nano-Crystalline Silicon Film and Si Nanorods” Materials Research Society Symp. Proc., 2002, vol. 715, pp. A8.2.1-A8.2.6.
Wu et al., “Growth and Characterization of Well-Aligned nc-Si/SiOxComposite Nanowires” Advanced Materials, 2002, vol. 14, No. 22, pp. 1643-1646.
Zhu et al., “Preparation and Formation Mechanism of Silicon Nanorods” Journal of Materials Science Letters, 1998, vol. 17, pp. 1897-1898.
“BioSilicon™ Applications” pSivida, http://www,psivida.com/application/other.asp, 2 pages.
Extended European Search date Jun. 14, 2011 issued EP 07 83 9257.

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