Wedge action electrical test probe

Details Wedge action electrical test probe Wedge action electrical test probe

1975-02-19

1977-01-04

Demeo, Palmer C.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

339108TP, 339 74R, 324149, 324158P, G01R 3102, H01R 1300

Patent

active

040016790

ABSTRACT:
A test probe for effecting temporary electrical connection to circuit terminals of miniature integrated circuits or like elements with small inter-terminal spacings. The probe has an insulative tip having a cross-sectional dimension smaller than the space between adjacent terminals. In an axially extending groove in the tip is a stiff wire, and a mechanism is provided for controllably moving the wire out of the groove after the tip has been inserted between two terminals. When the wire moves out of the groove, it contacts one of the electric terminals and wedges the insulative tip against the adjacent terminal so as to retain the probe in place.

REFERENCES:
patent: 3108842 (1963-10-01), Gorman
patent: 3182257 (1965-05-01), Linkowski
patent: 3648221 (1972-03-01), Tillmann et al.
"Scope Probe," E. T. Heitzman IBM Tech. Discl. Bulletin, vol. 7, No. 5, Oct. 1964, pp. 393-394.
Kurtz, "Probe and Probe Head for Tester," IBM Tech. Discl. Bulletin, vol. 9, No. 11, Apr. 1967, pp. 1507-1508.

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