Signals and indicators – Indicators – Element wear type
Patent
1998-01-09
1999-09-07
Utech, Benjamin
Signals and indicators
Indicators
Element wear type
73 86, 250396R, 2504922, 25049221, G01B 1500, G01B 2108, G21K 504, G21K 508
Patent
active
059470534
ABSTRACT:
The present invention relates to wear-through detection in multilayered parts. This invention specifically encompasses, in one aspect, wear-through detection in semiconductor vacuum processing systems in which a wear indicator that will release a detectable constituent upon exposure to processing conditions is used inside the semiconductor vacuum processing tool. This invention permits real time detection of wear during operation of semiconductor vacuum processing equipment.
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Burnham Jay
Linde Harold G.
Mone, Jr. Nicholas N.
Warren Ronald A.
Champagne Donald L.
International Business Machines - Corporation
Leas James M.
Utech Benjamin
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