Weak-link capacitor

Semiconductor device manufacturing: process – Making passive device – Planar capacitor

Reexamination Certificate

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C438S239000, C438S243000, C438S250000, C438S253000, C438S386000, C438S396000, C438S780000, C257SE21008, C257SE21396, C257SE21647, C257SE21007

Reexamination Certificate

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07955945

ABSTRACT:
A process for making a dielectric material where a precursor polymer selected from poly(phenylene vinylene) polyacetylene, poly(p-phenylene), poly(thienylene vinylene), poly(1,4-naphthylene vinylene), and poly(p-pyridine vinylene) is energized said by exposure by radiation or increase in temperature to a level sufficient to eliminate said leaving groups contained within the precursor polymer, thereby transforming the dielectric material into a conductive polymer. The leaving group in the precursor polymer can be a chloride, a bromide, an iodide, a fluoride, an ester, an xanthate, a nitrile, an amine, a nitro group, a carbonate, a dithiocarbamate, a sulfonium group, an oxonium group, an iodonium group, a pyridinium group, an ammonium group, a borate group, a borane group, a sulphinyl group, or a sulfonyl group.

REFERENCES:
patent: 2009/0110811 (2009-04-01), Ding et al.
Ajayaghosh, A., Das, S., and George, M.V., “S-Benzoyl O-Ethyl Xanthate as a New Photoinitiator: Photopolymerization and Laser Flash Photolysis Studies,” J. of Polymer Scie.
Johnson, R.S. Cicotte, K.N., Mahoney, P.J., Tuttle, B.A., and Dirk, S.M., “Thermally Induced Failure of Polymer Dielectrics,” Adv. Mater. 22, 1750-1753, 2010.

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