Image analysis – Pattern recognition – Template matching
Patent
1997-10-02
1999-10-26
Boudreau, Leo H.
Image analysis
Pattern recognition
Template matching
382280, 356347, 359 9, 342362, G06K 976, G06K 936
Patent
active
059741783
ABSTRACT:
The reconstruction region of a hologram reconstructed image is segmented. A fast Fourier transform (FFT) is carried out after multiplying the hologram measurement data V(R) by a weighting function. A fast Fourier transform (FFT) is carried out after multiplying the antenna sensitivity inverse matrix A.sup.-1 (R'.sub.a,b) for each segment by inverse propagation function r'.sub.a,b exp(j2.pi.r'.sub.a,b /.lambda.) to find B.sup.-1.sub.a,b (s, t), and then multiplying this by a weighting function. After the two FFT outputs are multiplied by each other, inverse fast Fourier transform (IFFT) is carried out. Compensation is performed for the weighting function and the output is made the segment reconstructed image. In addition, radio hologram observation is carried out at two scan surfaces, a horizontal polarization antenna and a vertical polarization antenna are placed at each scan surface, and the voltage vector distribution received by the antennas is stored. The sizes of the error of the reception antenna sensitivity matrix of the vertical polarization reception antenna and the error of the reception antenna sensitivity matrix of the horizontal polarization reception antenna are found, and the received voltage vectors and reception antenna sensitivity inverse matrices are selectively used to find and visualize the three wavesource current vector components.
REFERENCES:
patent: 5734347 (1998-03-01), McEligot
patent: 5748314 (1998-05-01), Kitayoshi
E.N. Voronin, Radioelectronics and Communication Systems, vol. 33, No. 2, pp. 54-65, "Efficient Numberical Holographic-Reconstruction Algorithms", 1990.
Hitoshi Kitayoshi, "High Resolution Technique for Short Time Frequency Spectrum Analysis", IEICE, vol. J76-A, No. 1, Jan. 1993, pp. 78-81.
Hitoshi Kitayoshi, "High Resolution Technique for 2-D Complex Spectrum Analysis", IEICE, Transactions on A, vol. J76-A, No. 4, Apr. 1993, pp. 687-689.
Advantest Corporation
Boudreau Leo H.
Mehta Bhavesh
LandOfFree
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