Wavemeter with increased wavelength range

Details Wavemeter with increased wavelength range Wavemeter with increased wavelength range

2005-06-28

2005-06-28

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

C356S454000

Reexamination Certificate

active

06912051

ABSTRACT:
A wavemeter (30) comprises a first wavelength determination unit (40) having a substantially periodic wavelength dependency and being adapted for providing a reference wavelength dependency (100) over a reference wavelength range. A second wavelength determination unit (50) has a substantially periodic wavelength dependency and is adapted for providing a second wavelength dependency (140) over a second wavelength range (120). An evaluation unit (60) compares the second wavelength dependency (140) with the reference wavelength dependency (100) for adjusting (160) the second wavelength dependency (140) in wavelength.

REFERENCES:
patent: 4309108 (1982-01-01), Siebert
patent: 5550636 (1996-08-01), Hagans et al.
patent: 6421120 (2002-07-01), Wildnauer
patent: 6500521 (2002-12-01), O'Brien
patent: 1 099 943 (2001-05-01), None
patent: 2 350 184 (2000-11-01), None
patent: 2 353 858 (2001-03-01), None
Jacquin, J., Examiner. European Search Report, Application No. EP 01 12 5041, dated Mar. 19, 2002.

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