Wavemeter and an arrangement for the adjustment of the wavelengt

Details Wavemeter and an arrangement for the adjustment of the wavelengt Wavemeter and an arrangement for the adjustment of the wavelengt

1998-03-30

2000-03-28

Font, Frank G.

Optics: measuring and testing

By particle light scattering

With photocell detection

356345, 356349, 356 72, G01B 902, G01J 345, G01N 2100

Patent

active

060438835

ABSTRACT:
This invention relates to a wavemeter and an apparatus for the adjustment of the wavelength of a laser source. The invention proposes a wavemeter comprising an optical component, which generates an optical beam with a wavelength which depends on the optical power of the incident beam to be measured. To increase the precision of the wavelength measurement, the wavemeter is provided with a second measurement channel, whose optical signals are retarded by .pi./2 relative to the optical signals in a first measurement channel. The first and second measurement channels either each comprise a different etalon or the wavemeter comprises a single retardation plate to obtain the desired retardation. After calibration of the wavemeter, the optical power of the beam generated by the optical component is measured, the measured value of the optical power is compared with the power values of the calibration data and the wavelength in the calibration data corresponding to the measured value of the optical power is determined. A controller, such as a PC, compares the measured wavelength with the desired wavelength and automatically adjusts the wavelength of the signals generated by the laser source.

REFERENCES:
patent: 5822049 (1998-10-01), Dimmick
patent: 5841536 (1998-11-01), Dimmick
Optics Communications, vol. 14, No. 4, Aug. 1975, pp. 438-441, P. Juncar et al., "A New Method for Frequency Calibration and Control of a Laser".

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