Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-12-25
2007-12-25
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S076000
Reexamination Certificate
active
10749416
ABSTRACT:
In one embodiment, a method for wavelet analysis of one or more time domain reflectometry (TDR) signals to determine one or more characteristics of one or more anomalies in a wire includes receiving a TDR signal that has reflected back up a wire from an anomaly in the wire, calculating a wavelet analysis result from a wavelet analysis of the TDR signal, accessing a library of one or more reference wavelet analysis results that each correspond to one or more known anomalies having one or more known characteristics, and comparing the wavelet analysis result with one or more reference wavelet analysis results. If the wavelet analysis result corresponds to one or more particular reference wavelet analysis results, it is indicated that the anomaly in the wire has one or more particular known characteristics of one or more particular known anomalies corresponding to the one or more particular reference wavelet analysis results. If the wavelet analysis result of the TDR signal does not correspond to one or more reference wavelet analysis results, it is indicated that the anomaly in the wire lacks one or more known characteristics of one or more known anomalies corresponding to one or more reference wavelet analysis results in the library.
REFERENCES:
patent: 6311130 (2001-10-01), Huang
patent: 2004/0230383 (2004-11-01), Bechhoefer et al.
Michael Dockins, Texas Instruments, Inc., “Frequency Domain Analysis of Time Domain Reflectometry Signals,” Aug. 9, 2002, 43 pages, Aug. 2, 2002.
Michael Dockins, “Affidavit of Michael D. Dockins,” signed Jan. 15, 2004, 2 pages.
Dr. Krzysztof Michalski “Affidavit of Dr. Krzysztof Michalski,” signed Jan. 15, 2004, 2 pages.
Dockins Michael D.
Ramanujachar Kartik
Wills Kendall S.
Brady III Wade James
Bui Bryan
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Tung Yingsheng
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