Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2009-02-27
2011-11-01
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C356S308000, C356S328000
Reexamination Certificate
active
08049883
ABSTRACT:
A swept wavelength interrogation system includes a tunable light source for outputting a light beam that is tunable over a range of wavelengths and an optical reader head for distributing the light beam among a plurality of sensors and for measuring response spectra from the sensors. A wavelength-tracking device measures centroid wavelengths of the light beam. A processor calculates a centroid wavelength of the response spectra from the sensors based on the measured centroid wavelengths of the light beam.
REFERENCES:
patent: 4815843 (1989-03-01), Tiefenthaler et al.
patent: 6429022 (2002-08-01), Kunz et al.
patent: 6785433 (2004-08-01), Tiefenthaler
patent: 7217951 (2007-05-01), Krishna et al.
patent: 7310153 (2007-12-01), Kiesel et al.
patent: 7355162 (2008-04-01), Sidorin
patent: 2006/0050271 (2006-03-01), McDonald
patent: 2007/0020689 (2007-01-01), Caracci et al.
patent: 2008/0204760 (2008-08-01), Gollier et al.
patent: 2008/0315078 (2008-12-01), Ono
patent: WO 01/16569 (2001-03-01), None
patent: WO 2004/092730 (2004-10-01), None
Ph.M. Nellen, et al., “Integrated Optical Input Grating Couplers as Biochemical Sensors”,Sensors and Actuators, 1988, vol. 15, pp. 285-295.
T.C. Black, “Physics 102 Lab 8: Measuring Wavelengths with a Diffraction Grating”, Spring 2005.
T. Farrell, et al., “Tunable Laser Technology for Sensing Applications”,Physics and Application of Optoelectronic Devices, Proceedings of SPIE, vol. 5594, pp. 66-80, 2004.
The Corning Epic® System, New Targets. New Information, Overview Brochure, 2007.
Epic® System presentation, A. Frutos, 2006.
Webb Michael B.
Wu Qi
Corning Incorporated
Evans F. L.
Haack John L.
Ryan Thomas
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