Wavelength specific optical reflection meter/locator in signatur

Details Wavelength specific optical reflection meter/locator in signatur Wavelength specific optical reflection meter/locator in signatur

1998-02-26

2000-08-29

Chan, Jason

Optical: systems and elements

Deflection using a moving element

Using a periodically moving element

359177, 359110, H04B 1002, H04B 1008

Patent

active

061116769

ABSTRACT:
In WDM systems, each wavelength travels over a different optical paths, thus having different reflections within the path. This method for detecting reflections in bidirectional multichannel communication systems uses a unique signature attached to each signal. This allows to isolate reflections within each optical path, by measuring the optical power of a signal and of the reflection, by measuring the power of the signal and the power of the reflection. The location of the reflection is determined by calculating the relative delay between the signal and the respective reflection.

REFERENCES:
patent: 5513029 (1996-04-01), Roberts
patent: 5654816 (1997-08-01), Fishman
patent: 5699081 (1997-12-01), Denkin et al.
patent: 5859716 (1999-06-01), O'Sullivan et al.

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