Wavelength specific detection system for measuring the partial p

Details Wavelength specific detection system for measuring the partial p Wavelength specific detection system for measuring the partial p

1986-05-27

1987-09-08

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250423P, H01J 2700

Patent

active

046926305

ABSTRACT:
An optical partial pressure gas analyzer employs an electron beam to excite the outer electrons of gas atoms or molecules, and one or more photomultiplier tubes or other similar detectors to detect wavelengths of photons characteristic of the decay of the outer electrons of one or more species of gas molecules. The photomultiplier tubes have a viewing direction substantially at right angles to the electron beam. A Faraday trap or similar device is employed to avoid secondary electron generation. Thin-film interference filters are favorably employed to pass a specific characteristic wavelength of the desired species, and to reject other wavelengths. An electromechanical filter changer permits each photomultiplier tube to analyze two or more gasses alternately.

REFERENCES:
patent: 4170736 (1979-10-01), Wessel
patent: 4362936 (1982-12-01), Hofmann et al.
patent: 4413185 (1983-11-01), Leveson et al.

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