Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2006-11-07
2006-11-07
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
C356S519000
Reexamination Certificate
active
07133136
ABSTRACT:
A wavelength monitoring device for monitoring a beam of light is disclosed having a beam splitter, with opposing first and second spaced apart faces, for receiving optical radiation from the beam of light to be monitored. In operation the first face reflects a first portion of the optical radiation to a first photodiode. The second face includes a grating for reflecting a second portion of the optical radiation to the first photodiode. The grating also reflects a third portion of optical radiation to a second photodiode. The light received by the second photodiode corresponds proportionally to optical power of the incident beam of light. The first photodiode is for detecting a wavelength characteristic of the composite beam and is located so as to receive the first portion and the second portion of optical radiation after the first portion and the second portion of optical radiation have optically interfered to form a composite beam. The first face and the grating are oriented and spaced from one another so that the first and second portions of the optical radiation optically interfere with one another along a path toward the first photodiode.
REFERENCES:
patent: 4309671 (1982-01-01), Malyon
patent: 5825792 (1998-10-01), Villeneuve et al.
patent: 6005995 (1999-12-01), Chen et al.
patent: 6122301 (2000-09-01), Tei et al.
patent: 6144025 (2000-11-01), Tei et al.
patent: 6411634 (2002-06-01), Zhang et al.
patent: 6549548 (2003-04-01), Kuznetsov et al.
patent: 6587214 (2003-07-01), Munks
patent: 6621580 (2003-09-01), Myatt et al.
patent: 7038782 (2006-05-01), Hedin et al.
patent: 7075656 (2006-07-01), Hedin
patent: 2003/0063871 (2003-04-01), Yabe et al.
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
JDS Uniphase Corporation
Lyons Michael A.
Toatley , Jr. Gregory J.
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