Optics: measuring and testing – For light transmission or absorption – Of fluent material
Reexamination Certificate
2007-07-31
2007-07-31
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
For light transmission or absorption
Of fluent material
Reexamination Certificate
active
11011691
ABSTRACT:
A wavelength modulation spectroscopy method for measuring the concentration of a gas component is provided. A gas sample portion of the light is passed through a reference gas comprising the gas component in a constant concentration. Afterwards, the light is detected by a reference detector. Another portion of the light is passed through the gas sample and thereafter to a measuring detector. The light emitted by the light source is modulated with a frequency, while the wavelength is swept over a molecular absorption line of the gas component. Demodulation of the detector outputs is made at a higher harmonic. In order to compensate for variations of the modulation parameters of the light source in real time, a mathematical description of the demodulated reference detector output based on Fourier analysis of the modulated light and on a mathematical expression for the absorption line is provided.
REFERENCES:
patent: 5572031 (1996-11-01), Cooper et al.
patent: 6351309 (2002-02-01), Bomse et al.
patent: 6356350 (2002-03-01), Silver et al.
patent: 6611335 (2003-08-01), Hovde
patent: 7116422 (2006-10-01), Larking et al.
patent: 2005/0140979 (2005-06-01), Kluczynski et al.
Pawel Kluczynski and Ove Axner, “Theoretical description based on Fourier analysis of wavelength-modulation spectrometry in terms of analytical and background signals”, Applied Optics, Optical Society of America, Washington, US, vol. 38, No. 27, Sep. 20, 1999, pp. 5803-5815, XP001176660.
Joel A. Silver, “Frequency-modulation spectroscopy for trace species detection: theory and comparison among experimental methods”, Applied Optics, Optical Society of America, Washington, US, vol. 31, No. 6, Feb. 20, 1992, pp. 707-717, XP000248585.
Kluczynski Pawel
Margolis Jack
Nygren Jan
Siemens Aktiengesellschaft
Skovholt Jonathan
Toatley , Jr. Gregory J.
LandOfFree
Wavelength modulation spectroscopy method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wavelength modulation spectroscopy method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wavelength modulation spectroscopy method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3762798