Wavelength meter having elliptical wedge

Details Wavelength meter having elliptical wedge Wavelength meter having elliptical wedge

1989-01-18

1992-12-01

Hellner, Mark

Optics: measuring and testing

By particle light scattering

With photocell detection

356352, H01S 300

Patent

active

051683245

ABSTRACT:
A wavelength meter is disclosed which can determine the wavelength of a laser beam from a laser source within an accuracy range of two parts in 10.sup.8. The wavelength meter has wedge having an elliptically shaped face to the optical path of the laser source and includes interferometer plates which form a vacuum housing.

REFERENCES:
patent: 3246557 (1966-04-01), Mertz et al.
patent: 3432238 (1969-03-01), Girard
patent: 3563663 (1971-02-01), Barringer
patent: 4092070 (1978-05-01), Smithline
patent: 4165938 (1974-08-01), Doyle
patent: 4172663 (1979-10-01), Byer et al.
patent: 4173442 (1979-11-01), Snyder
patent: 4355898 (1982-10-01), Dakin
patent: 4426155 (1984-01-01), Monchalin
patent: 4585345 (1986-04-01), Inoue
patent: 4632553 (1986-12-01), Vidrine et al.

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