Wavelength measurement method based on combination of two...

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

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Reexamination Certificate

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11651372

ABSTRACT:
In a dual etalon wavelength monitor, improved performance is obtained by identifying first and second dead zones where the first and second etalon signals respectively have significantly reduced sensitivity. When a measurement is in the first dead zone, only the second etalon signal is employed to determine wavelength. When a measurement is in the second dead zone, only the first etalon signal is employed to determine wavelength. When a measurement is in neither zone, both first and second etalon signals are employed to determine the wavelength.

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