Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2008-09-02
2008-09-02
Lyons, Michael A (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
11651372
ABSTRACT:
In a dual etalon wavelength monitor, improved performance is obtained by identifying first and second dead zones where the first and second etalon signals respectively have significantly reduced sensitivity. When a measurement is in the first dead zone, only the second etalon signal is employed to determine wavelength. When a measurement is in the second dead zone, only the first etalon signal is employed to determine wavelength. When a measurement is in neither zone, both first and second etalon signals are employed to determine the wavelength.
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Lumen Patent Firm, Inc.
Lyons Michael A
Picarro, Inc.
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