Wavelength-dispersive X-ray spectrometer

Details Wavelength-dispersive X-ray spectrometer Wavelength-dispersive X-ray spectrometer

2011-01-04

2011-01-04

Thomas, Courtney (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S070000, C378S071000

Reexamination Certificate

active

07864922

ABSTRACT:
An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of characteristic X-rays to background intensity by using only effective diffractive regions of the analyzing crystal. X-ray blocking plates upstand from an end of a crystal support member supporting the analyzing crystal in the direction of angular dispersion of the crystal toward the inside of a Rowland circle. Incident X-rays going from the point X-ray source toward the crystal and X-rays diffracted by the crystal toward an X-ray detector are partially blocked by the X-ray blocking plates. The shielded regions vary according to the incident angle θ of the incident X-rays. Optimum or nearly optimum effective regions of the surface of the crystal can be used at all times.

REFERENCES:
patent: 3439163 (1969-04-01), De Jongh
patent: 52-027695 (1977-03-01), None
patent: 10-239495 (1998-09-01), None

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