Wavelength determining device, wavelength meter equipped...

Optics: measuring and testing – By light interference

Reexamination Certificate

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C356S484000

Reexamination Certificate

active

11388983

ABSTRACT:
There is provided a wavelength determining device including a reference wavelength measuring section42that, based upon a number A of interference fringes generated by an optical path difference of first reference wavelength light (wavelength: λ1) and a number C of interference fringes generated by the optical path difference of second reference wavelength light (wavelength: λ2), measures the wavelength of the second reference wavelength light, an input light wavelength measuring section44, based upon the number A of the interference fringes generated by the optical path difference of the first reference wavelength light (wavelength: λ1) and a number B of interference fringes generated by the optical path difference of input light (wavelength: λx), measures the wavelength of the input light, a correction coefficient determining section46that determines a second correction coefficient k based upon the measured wavelength λc of the second reference wavelength light and the measured wavelength λm of the input light, and an input light wavelength correcting section48that corrects the measured wavelength of the input light by multiplying the measured wavelength λm of the input light by the second correction coefficient k, in order to correctly measure the wavelength λx(=k·λm) of the input light.

REFERENCES:
patent: 6115122 (2000-09-01), Bao et al.
patent: 6594019 (2003-07-01), Ichikawa et al.
patent: 6633371 (2003-10-01), Lu et al.
patent: 2001/0033385 (2001-10-01), Unno et al.
patent: 2002/0149776 (2002-10-01), Braun et al.
patent: 2005/0062975 (2005-03-01), Morris
patent: 8-029255 (1996-02-01), None
patent: 10-221020 (1998-08-01), None
English Language Abstract of JP 8-029255. Feb. 2, 1996.
English Language Abstract of JP 10-221020. Aug. 21, 1998.

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