Optics: measuring and testing – By light interference
Reexamination Certificate
2006-01-31
2006-01-31
Lee, Hwa(Andrew) (Department: 2877)
Optics: measuring and testing
By light interference
Reexamination Certificate
active
06992774
ABSTRACT:
An apparatus for determining the wavelength of light emitted by, for example, a laser, includes three photodiodes. One photodiode receives a proportion of the light redirected from the main optical path by a beam splitter. A second photodiode receives a proportion of the light redirected from the main optical path by the beam splitter and passing through a broadband filter. A third photodiode receives light that has been caused to interfere by an interferometric device. The ratio of the light intensities at the first and second photodiodes provide a coarse determination of wavelength, when compared to a lookup table, and the ratio of the light intensities at the first and third photodiodes provide a more exact determination of the wavelength.
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Patent Abstracts of Japan, Publication No. 05340839.
Creasey Christopher David
Meadowcroft Simon
Agilent Technologie,s Inc.
Lee Hwa(Andrew)
Lyons Michael A.
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