Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2007-03-27
2007-03-27
Lee, Hwa(Andrew) (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
10341364
ABSTRACT:
In a wavelength detecting apparatus using an etalon, a drift in wavelength measurement by the etalon is stabilized and an adverse influence of out gas is eliminated, so that correct wavelength measurement is realized. The wavelength detecting apparatus includes a housing equipped with a port for use of introducing replacement gas, an etalon set inside the housing, and a moisture-absorbing unit for absorbing at least moisture released inside the housing.
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Japanese Office Action dated Sep. 30, 2005 with partial English translation.
Japanese Office Action dated Sep. 28, 2006 with partial English translation.
Enami Tatsuo
Kubo Hirokazu
Moriya Masato
Shinbori Masashi
Suzuki Toru
Gigaphoton Inc.
Lee Hwa(Andrew)
Stevens Davis Miller & Mosher LLP
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