Wavelength and intensity monitoring of optical cavity

Details Wavelength and intensity monitoring of optical cavity Wavelength and intensity monitoring of optical cavity

2008-02-07

2010-12-14

Harvey, Minsun (Department: 2828)

Optics: measuring and testing

By light interference

Having light beams of different frequencies

C356S450000, C372S050210

Reexamination Certificate

active

07852486

ABSTRACT:
According to various illustrative embodiments, a device, method, and system for measuring optical fine structure of lateral modes of an optical cavity are described. In one aspect, the device comprises at least one photodetector arranged to detect an output of the optical cavity in a lateral direction thereof. The device also comprises an analyzer coupled to an output of the at least one photodetector and arranged to analyze at least a portion of signals produced in the at least one photodetector by at least a portion of the lateral modes of the optical cavity. The device also comprises a processor arranged to determine the optical fine structure of the at least the portion of the lateral modes of the optical cavity based on an output of the analyzer.

REFERENCES:
patent: 5684586 (1997-11-01), Fortenberry et al.
Stelmakh, Nikolai & Flowers, Max; “Measurement of Spatial Modes of Broad-Area Diode Lasers With 1-GHz Resolution Grating Spectrometer,” IEEE Photonics Technology Letters, Aug. 1, 2006, pp. 1618-1620, vol. 18, No. 15, IEEE, U.S.A.

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