Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1981-12-28
1984-10-02
Willis, Davis L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
350358, 356354, G01B 902
Patent
active
044744676
ABSTRACT:
A wavefront sensor for detecting the slope of an input wavefront. A surface acoustic wave reflective diffraction grating is positioned at a focal point of the wavefront, and generates surface acoustic waves at two primary frequencies f.sub.1 and f.sub.2. The reflective diffraction grating produces a first AC shearing interferogram between two like diffraction orders generated by the f.sub.1 and f.sub.2 surface acoustic waves. A photodetector array is positioned to detect the shearing interferogram at a two dimensional array of zones, and the phase of the output signal for each zone is representative of the local slope of the wavefront in the direction of shearing, thus producing the slope in one direction. Complete two dimensional wavefront slope information is obtained by shearing the wavefront in a second orthogonal direction in substantially the same manner utilizing a second surface acoustic wave diffraction grating and a second photodetector array.
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Ebersole et al., "Collimated Light Acoustooptic Lateral Shearing Interferometer", Applied Optics, vol. 13, No. 5, pp. 1004-1005, 5/1974.
Everson Jeffrey H.
Hardy John W.
Blair Homer O.
Glanzman Gerald H.
Itek Corporation
Koren Matthew W.
Nathans Robert L.
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