Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1984-06-18
1986-03-11
Willis, Davis L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, G01B 902
Patent
active
045752486
ABSTRACT:
A wavefront sensor employs a novel DC shearing interferometer which produces four interferograms which are 90.degree. phase shifted with respect to each other. The incoming wavefront is replicated into two beams, a portion of each being reflected off of a beamsplitter and the remaining portion being transmitted therethrough, at first and second portions of the beamsplitter. After leaving the beamsplitter the transmitted and reflected beams are reflected back 180.degree. by a pair of retroreflectors, and directed at third and fourth portions of the beamsplitter. The retroreflectors are adjusted to produce four shearing interferograms and a quarter wave plate is positioned in the path of one of the beams to cause the four interferograms to have a 90.degree. phase shifted relationship with respect to each other. The interferograms are thereafter projected upon intensified self scanning diode arrays, which digitize the interference patterns for convenient processing by means of a four-bin algorithm, which in turn generates estimated phase data indicative of the shape of the wavefront in a given direction. The process may be duplicated to produce second measurements in an orthogonal direction, which enables the mapping of the wavefront in both X and Y. In contrast with A.C. shearing interferometers, the wavefront shapes of very brief plused beams of light may be measured.
REFERENCES:
patent: 3829219 (1974-08-01), Wyant
patent: 4084907 (1978-04-01), Pinard et al.
Assa et al., "Slope and Curvature Measurement by a Double-Frequency Grating Shearing Interferometer", Experimental Mechanics, vol. 19, No. 4, pp. 129-137, Apr. 1979.
Horwitz Bruce A.
MacGovern Alan J.
Itek Corporation
Koren Matthew W.
Rotella Robert F.
Wallach Michael H.
Willis Davis L.
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