Optics: measuring and testing – Lamp beam direction or pattern
Patent
1995-12-15
1997-05-13
Pham, Hoa Q.
Optics: measuring and testing
Lamp beam direction or pattern
2502019, G01J 120
Patent
active
056297653
ABSTRACT:
A geometric sensor includes a Monolithic Lenslet Module (MLM) subaperture array having a plurality of microlenses, each of which have an opaque center formed concentric with the microlens optical axis, at the location of the lens chief ray, to produce an integral geometric reference (IGR) spot pattern of the lens array which is used to correct for sensor errors to an accuracy comparable with that achieved with reference plane wave calibration.
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Adaptive Optics Associates, Inc.
Chiantera Dominic J.
Pham Hoa Q.
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