Optical: systems and elements – Lens – Annular zonal correcting
Reexamination Certificate
2005-01-11
2005-01-11
Epps, Georgia (Department: 2873)
Optical: systems and elements
Lens
Annular zonal correcting
C359S558000, C359S279000, C382S279000, C250S216000, C356S124500
Reexamination Certificate
active
06842297
ABSTRACT:
Improved Wavefront Coding Optics, which apply a phase profile to the wavefront of light from an object to be imaged, retain their insensitivity to focus related aberration, while increasing the heights of the resulting MTFs and reducing the noise in the final images. Such improved Wavefront Coding Optics have the characteristic that the central portion of the applied phase profile is essentially flat (or constant), while a peripheral region of the phase profile around the central region alternately has positive and negative phase regions relative to the central region.
REFERENCES:
patent: 2959105 (1960-11-01), Sayanagi
patent: 3054898 (1962-09-01), Westover et al.
patent: 3305294 (1967-02-01), Alvarez
patent: 3583790 (1971-06-01), Baker
patent: 3614310 (1971-10-01), Korpel
patent: 3856400 (1974-12-01), Hartmann et al.
patent: 3873058 (1975-03-01), Whitehouse
patent: 4062619 (1977-12-01), Hoffman
patent: 4082431 (1978-04-01), Ward, III
patent: 4174885 (1979-11-01), Joseph et al.
patent: 4178090 (1979-12-01), Marks et al.
patent: 4255014 (1981-03-01), Ellis
patent: 4275454 (1981-06-01), Klooster, Jr.
patent: 4276620 (1981-06-01), Kahn et al.
patent: 4308521 (1981-12-01), Casasent et al.
patent: 4349277 (1982-09-01), Mundy et al.
patent: 4466067 (1984-08-01), Fontana
patent: 4480896 (1984-11-01), Kubo et al.
patent: 4573191 (1986-02-01), Kidode et al.
patent: 4575193 (1986-03-01), Greivenkamp, Jr.
patent: 4580882 (1986-04-01), Nuchman et al.
patent: 4589770 (1986-05-01), Jones et al.
patent: 4642112 (1987-02-01), Freeman
patent: 4650292 (1987-03-01), Baker et al.
patent: 4655565 (1987-04-01), Freeman
patent: 4725881 (1988-02-01), Buchwald
patent: 4734702 (1988-03-01), Kaplan
patent: 4794550 (1988-12-01), Greivenkamp, Jr.
patent: 4804249 (1989-02-01), Reynolds et al.
patent: 4825263 (1989-04-01), Desjardins et al.
patent: 4827125 (1989-05-01), Goldstein
patent: 4843631 (1989-06-01), Steinpichler et al.
patent: 4936661 (1990-06-01), Betensky et al.
patent: 4964707 (1990-10-01), Hayashi
patent: 4989959 (1991-02-01), Plummer
patent: 5003166 (1991-03-01), Girod
patent: 5076687 (1991-12-01), Adelson
patent: 5102223 (1992-04-01), Uesugi et al.
patent: 5128874 (1992-07-01), Bhanu et al.
patent: 5142413 (1992-08-01), Kelly
patent: 5165063 (1992-11-01), Strater et al.
patent: 5166818 (1992-11-01), Chase et al.
patent: 5193124 (1993-03-01), Subbarao
patent: 5218471 (1993-06-01), Swanson et al.
patent: 5243351 (1993-09-01), Rafanelli et al.
patent: 5248876 (1993-09-01), Kerstens et al.
patent: 5270825 (1993-12-01), Takasugi et al.
patent: 5270861 (1993-12-01), Estelle
patent: 5270867 (1993-12-01), Estelle
patent: 5280388 (1994-01-01), Okayama et al.
patent: 5299275 (1994-03-01), Jackson et al.
patent: 5301241 (1994-04-01), Kirk
patent: 5307175 (1994-04-01), Seachman
patent: 5317394 (1994-05-01), Hale et al.
patent: 5337181 (1994-08-01), Kelly
patent: 5426521 (1995-06-01), Chen et al.
patent: 5438366 (1995-08-01), Jackson et al.
patent: 5442394 (1995-08-01), Lee
patent: 5444574 (1995-08-01), Ono et al.
patent: 5465147 (1995-11-01), Swanson
patent: 5473473 (1995-12-01), Estelle et al.
patent: 5476515 (1995-12-01), Kelman et al.
patent: 5521695 (1996-05-01), Cathey, Jr. et al.
patent: 5532742 (1996-07-01), Kusaka et al.
patent: 5555129 (1996-09-01), Konno et al.
patent: 5565668 (1996-10-01), Reddersen et al.
patent: 5568197 (1996-10-01), Hamano
patent: 5572359 (1996-11-01), Otaki et al.
patent: 5610684 (1997-03-01), Shiraishi
patent: 5640206 (1997-06-01), Kinoshita et al.
patent: 5706139 (1998-01-01), Kelly
patent: 5748371 (1998-05-01), Cathey et al.
patent: 5751475 (1998-05-01), Ishiwata et al.
patent: 5756981 (1998-05-01), Roustaei et al.
patent: 5969853 (1999-10-01), Takaoka
patent: 5969855 (1999-10-01), Ishiwata et al.
patent: 6021005 (2000-02-01), Cathey et al.
patent: 6025873 (2000-02-01), Nishioka et al.
patent: 6034814 (2000-03-01), Otaki
patent: 6037579 (2000-03-01), Chan et al.
patent: 6069738 (2000-05-01), Cathey et al.
patent: 6091548 (2000-07-01), Chen
patent: 6097856 (2000-08-01), Hammond, Jr.
patent: 6121603 (2000-09-01), Hang et al.
patent: 6128127 (2000-10-01), Kusaka
patent: 6144493 (2000-11-01), Okuyama et al.
patent: 6172723 (2001-01-01), Inoue et al.
patent: 6172799 (2001-01-01), Raj
patent: 6208451 (2001-03-01), Itoh
patent: 6218679 (2001-04-01), Takahara et al.
patent: 6219113 (2001-04-01), Takahara
patent: 6248988 (2001-06-01), Krantz
patent: 6525302 (2003-02-01), Dowski et al.
patent: 20020195548 (2002-12-01), Dowski et al.
patent: 20020196980 (2002-12-01), Dowski
patent: 20030169944 (2003-09-01), Dowski et al.
patent: 0531928 (1993-03-01), None
patent: 0584769 (1994-03-01), None
patent: 0618473 (1994-10-01), None
patent: 0742456 (1996-11-01), None
patent: 0759573 (1997-02-01), None
patent: 0791848 (1997-08-01), None
patent: 0981245 (2000-02-01), None
patent: 2278750 (1994-12-01), None
patent: 2000-98301 (2000-04-01), None
patent: WO 9957599 (1999-11-01), None
patent: WO 0052516 (2000-09-01), None
J. Ojeda-Castaneda, L. R. Berriel-Valdos, and E. Montes, “Spatial filter for increasing the depth of focus”, Optics Letters, vol. 10, No. 11, p520-522, Nov., 1985.
J. Ojeda-Castaneda, and A. Diaz, “High focal depth by quasibifocus”, vol. 27, No. 20, p4163-4165, Oct. 15, 1988.
W. Chi and N. George, “Electronic imaging using a logarithmic asphere”, Optics Letters, vol. 28, No. 12, p 875-877, Jun. 15, 2001.
J. Ojeda-Castaneda, E. Tepichin, and A. Pons, “Apodization of annular apertures: Strehl ratio”, Applied Optics, vol. 27, No. 24, p 5140-5145, Dec. 15, 1988.
D. L. Marks, R. A. Stack, D. J. Brady, and J. Van der Gracht, “Three-dimensional tomography using a cubic-phase plate extended depth-of-field system”, Optics Letters, vol. 24, No. 4, p 253-255, Feb. 15, 1999.
S. C. Tucker, W. T. Cathey, and E. R. Dowski, Jr, “Extended depth of field and aberration control for inexpensive digital microscope systems”, Optics Express, vol. 4, No. 11, p467-474, May 24, 1999.
H. Bartelt, J. Ojeda-Castaneda, and E. E. Sicre, “Misfocus tolerance seen by simple inspection of the ambiguity function”, Applied Optics, vol. 23, No. 16, p. 2693-2696, Aug. 15, 1984.
J. Ojeda-Castaneda, L. R. Berriel-Valdos, and E. Montes, “Ambiguity function as a design tool for high focal depth”, Applied Optics, vol. 27, No. 4, p 790-795, Feb. 15, 1988.
J. Ojeda-Castaneda, P. Andres, and A. Diaz, “Annular apodizers for low sensitivity to defocus and to spherical aberration”, Optics Letters, vol. 11, No. 8, p 487-489, Aug., 1986.
J. Ojeda-Castaneda, E. Tepichin, and A. Diaz, “Arbitrarily high focal depth with a quasioptimum real and positive transmittance apodizer”, Applied Optics, vol. 28, No. 13, p 2866-2870, Jul. 1, 1989.
J. Ojeda-Castaneda, and L. R. Berriel-Valdos, “Arbitrarily high focal depth with finite apertures”, Optics Letters, vol. 13, No. 3, p 183-185, Mar., 1988.
G. Indebetouw, and H. Bai, “Imaging with Fresnel zone pupil masks: extended depth of field”, Applied Optics, vol. 23, No. 23, p 4299-4302, Dec. 1, 1984.
W. T. Welford, “Use of annular apertures to increase focal depth”, Journal of the Optical Society of America, vol. 50, No. 8, p 749-753, Aug., 1960.
C. Varamit, and G. Indebetouw, “Imaging properties of defocused partitioned pupils”, J. Opt. Soc. Am. A, vol. 2, No. 6, p 799-802, Jun. 1985.
E. R. Dowski Jr., and W. T. Cathey, “Single lens single-image incoherent passive-ranging systems”, Applied Optics, vol. 33, No. 29, p 6762-6773, Oct. 10, 1994.
W. T. Cathey, B. R. Frieden, W.T. Rhodes, and C. K. Rushforth, “Image gathering and processing for enhanced resolution”, J. Opt. Soc. Am. A, vol. 1, No. 3, p 241-250, Mar. 1984.
J. Van der Gracht, E. R., Dowski Jr., M. G. Taylor, and D. M. Deaver, “Broadband behavior of an optical-digital focus-invariant system”, Optics Letters, vol. 21, No. 13, p 919-921, Jul. 1, 1996.
G. Hausler, “A method to increase the depth
CDM Optics, Inc.
Dinh Jack
Epps Georgia
Lathrop & Gage L.C.
LandOfFree
Wavefront coding optics does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wavefront coding optics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wavefront coding optics will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3388440