Wavefront analysis method involving multilateral...

Details Wavefront analysis method involving multilateral... Wavefront analysis method involving multilateral...

2011-01-04

2011-01-04

Toatley, Gregory J (Department: 2877)

Optics: measuring and testing

By light interference

Having wavefront division

Reexamination Certificate

active

07864340

ABSTRACT:
The method comprises positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed and processing at least two interferograms of at least two different colors, each interferogram being obtained in a plane from two sub-beams with different diffraction orders. The invention can be used to analyze and correct divided wavefronts.

REFERENCES:
patent: 4832489 (1989-05-01), Wyant
patent: 5606417 (1997-02-01), Primot et al.
patent: 5671050 (1997-09-01), de Groot
patent: 5995224 (1999-11-01), de Groot
patent: 6072581 (2000-06-01), Stephenson et al.
patent: 6304330 (2001-10-01), Millerd
patent: 6577403 (2003-06-01), Primot et al.
patent: 6734978 (2004-05-01), Adachi
patent: 6785001 (2004-08-01), Almarzouk et al.
patent: 6853942 (2005-02-01), Drege et al.
patent: 6888639 (2005-05-01), Goebel et al.
patent: 7599071 (2009-10-01), Dillon et al.
patent: 7609388 (2009-10-01), Arieli et al.
patent: 7751063 (2010-07-01), Dillon et al.
patent: 2007/0091315 (2007-04-01), Brady et al.
patent: 2009/0073450 (2009-03-01), Boyd et al.
patent: 1 505 365 (2005-12-01), None
patent: 2 682 761 (1993-04-01), None
patent: 2 712 978 (1995-06-01), None
patent: 2 795 175 (2000-12-01), None
“Lateral Shearing Interferometers” by M. V. Mantravadi, Optical Shop Testing, Second Edition, 1992, John Wiley & Sons, Inc.

Affiliated with

Also associated with

Rating

Wavefront analysis method involving multilateral... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wavefront analysis method involving multilateral..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wavefront analysis method involving multilateral... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2716122