Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-05-04
2009-11-24
Lyons, Michael A (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S521000
Reexamination Certificate
active
07623247
ABSTRACT:
A measuring device for measuring a wavefront aberration of an optical system includes a first mask for defining light that enters the optical system, and a second mask having first to fourth openings. The first opening transmits a component of the light passing through the optical system without removing information about the wavefront aberration of the optical system, and the second to fourth openings transmit components of the light passing through the optical system having the information about the wavefront aberration of the optical system removed.
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Canon Kabushiki Kaisha
Canon U.S.A. Inc. I.P. Division
Hansen Jonathan M
Lyons Michael A
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