Waveform measuring instrument using interpolated data

Details Waveform measuring instrument using interpolated data Waveform measuring instrument using interpolated data

2007-05-15

2007-05-15

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

10318196

ABSTRACT:
The present invention is intended to provide a waveform measuring instrument which can carry out signal processing and waveform parameter measurement with high accuracy and at high resolution.In a waveform measuring instrument configured to write measured signal waveforms into a memory after converting the waveforms to digital data, the present invention is characterized by providing an interpolation system which performs interpolation between the above digital data and writing the data obtained after interpolation into the above memory.

REFERENCES:
patent: 5902244 (1999-05-01), Kobayashi et al.
patent: 8-173431 (1996-07-01), None
patent: 08-173431 (1996-07-01), None

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