Waveform measuring instrument using equivalent time sampling

Details Waveform measuring instrument using equivalent time sampling Waveform measuring instrument using equivalent time sampling

2005-06-21

2005-06-21

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S067000, C702S069000, C702S080000, C341S122000, C345S440100

Reexamination Certificate

active

06909979

ABSTRACT:
The present invention is intended to provide a waveform measuring instrument whose waveform reproducibility in the equivalent time sampling system is improved.The present invention is characterized by that, in a waveform measuring instrument configured so that the repeated waveform data items are acquired and sent to the acquisition memory by means of the equivalent time sampling, the above acquisition memory is divided into a plurality of time slot regions corresponding to the interval of equivalent time sampling and a plurality of memory address groups is assigned to each time slot region.

REFERENCES:
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patent: 4134149 (1979-01-01), Nord
patent: 4791404 (1988-12-01), Hollister
patent: 5978742 (1999-11-01), Pickerd
patent: 05257461 (1993-10-01), None

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