Waveform measuring apparatus for measuring waveform data and...

Details Waveform measuring apparatus for measuring waveform data and... Waveform measuring apparatus for measuring waveform data and...

2007-07-17

2007-07-17

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S067000, C702S070000, C702S080000, C324S076150

Reexamination Certificate

active

11104417

ABSTRACT:
A waveform measuring apparatus can sequentially and continuously read measurement data from an acquisition memory, where the measurement data has been written by multiple acquisitions, after acquisition stops. The waveform measuring apparatus writes measurement data to the acquisition memory based on a trigger signal, and includes a pseudo trigger signal generation unit that continuously reads measurement data that is written in the acquisition memory.

REFERENCES:
patent: 5929838 (1999-07-01), Hall
patent: 6271773 (2001-08-01), Kobayashi
patent: 6279130 (2001-08-01), Moser
patent: 6459256 (2002-10-01), Pickerd
patent: 6892150 (2005-05-01), Pickerd et al.
patent: 6909979 (2005-06-01), Saitou et al.
patent: 2002/0147554 (2002-10-01), Pickerd
patent: 2006/0020407 (2006-01-01), Montijo et al.
patent: 5-119069 (1993-05-01), None

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