Waveform measuring apparatus and method thereof

Details Waveform measuring apparatus and method thereof Waveform measuring apparatus and method thereof

2006-12-05

2008-08-19

Nguyen, Vincent Q. (Department: 2831)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

C324S076130

Reexamination Certificate

active

07414387

ABSTRACT:
A waveform measuring apparatus includes: a digital filter for removing a large-amplitude changing component from an input signal and for outputting a resultant output signal with a small-amplitude noise component left therein; a window generating section for receiving a differential signal between this input signal and the resultant output signal of the digital filter and for generating a window indicating a position of an edge portion of the differential signal; and a ringing measurement section for extracting, from the resultant output signal of the digital filter, a portion of waveform which is indicated by the window generated by the window generating section and for measuring at least a peak-to-peak amplitude of the portion of waveform.

REFERENCES:
patent: 4623837 (1986-11-01), Efron et al.
patent: 6795588 (2004-09-01), Nio et al.
patent: 7205769 (2007-04-01), Fujiwara
patent: 2003/0149457 (2003-08-01), Tcheng et al.
patent: 2006/0152630 (2006-07-01), Miyazawa
patent: 57017867 (1982-01-01), None
patent: 2167479 (1990-06-01), None
patent: 5045386 (1993-02-01), None
patent: 5045386 (1993-02-01), None
patent: 7151798 (1995-06-01), None
patent: 2000-278585 (2000-10-01), None
patent: 2002278585 (2002-09-01), None
patent: 2002278585 (2002-09-01), None
patent: 2004007292 (2004-01-01), None
patent: 2004007292 (2004-01-01), None
patent: 2004139682 (2004-05-01), None
patent: 2004139682 (2004-05-01), None
patent: 2005175743 (2005-06-01), None
patent: 2005175743 (2005-06-01), None

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