Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-09-28
2011-11-15
Charioui, Mohamed (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
08060327
ABSTRACT:
There is provided a waveform generator for generating an analog signal, including a data changing section which changes an input data sequence, which is to be modulated to the signal which the waveform generator should generate, to generate an after-change data sequence such that an initial phase and a final phase of the signal to be obtained by FSK modulation are continuous, a waveform generating section which generates basic waveform data representing a waveform corresponding to the signal obtained by subjecting the after-change data sequence to FSK modulation, and an output section which outputs the signal repeating the waveform represented by the basic waveform data.
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“Office Action of Japan Counterpart Application”, issued on Oct. 18, 2007, p1-p2, in which the listed references were cited.
Advantest Corporation
Charioui Mohamed
Jianq Chyun IP Office
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