Patent
1991-11-27
1995-07-18
Jankus, Almis
395139, 395155, 395161, G06T 340
Patent
active
054349540
DESCRIPTION:
BRIEF SUMMARY
TECHNICAL FIELD
The present invention relates to a waveform display apparatus of a frequency sweep type including a spectrum analyzer for analyzing the spectrum of a signal, a network analyzer for analyzing the characteristic of a circuit element, and the like and, more particularly, to a waveform display apparatus which can easily perform high-definition observation of a desired peak/dip portion in a displayed waveform.
BACKGROUND ART
As is well known, a waveform display apparatus such as a spectrum analyzer, a network analyzer, or the like displays the spectrum of a signal to be measured, the transfer characteristic of a circuit element to be measured, or the like while developing it on the frequency axis.
When a waveform is observed using a waveform display apparatus of such a frequency sweep type, it is required to be able to easily provide high-definition waveform observation for a user.
However, a conventional spectrum analyzer, network analyzer, or the like cannot satisfy the above-mentioned requirement in the present state. These problems of conventional techniques will be described below taking spectrum analyzer as an example.
In general, in a spectrum analyzer, when the spectrum of an unknown signal is to be analyzed and evaluated, the level and frequency of the spectrum displayed to be developed on the frequency axis must be observed.
However, an actually displayed spectrum resolution suffers from a limitation due to, e.g., characteristics of elements constituting the spectrum analyzer. More specifically, each spectrum pattern to be observed is not always displayed by a single line segment, but has a mountain-like pattern in which a spectrum upper portion forms a moderate curve, and its lower portion is spread, although it depends on a measurement condition. The level and frequency of a maximum level point (peak) of a spectrum display having a mountain-like pattern correspond to those of a spectrum to be observed. For this reason, the maximum point of the spectrum must be searched. When some spectra are present in a narrow frequency range, and their levels and frequencies are to be measured, each spectrum must be selected, and the maximum level on a display must be detected. Furthermore, in some cases, a spectrum may be displayed to have a valley-like pattern in a direction opposite to the above-mentioned case. In this case, the level and frequency of a minimum level point (dip) correspond to those of a spectrum to be observed.
In the spectrum analyzer for analyzing the spectrum in this manner, many functions allowing convenient analysis have already been added. Since the present invention provides some of these functions, various functions of the conventional spectrum analyzer will be individually explained in different items below for the sake of easy understanding of the characteristic features of the present invention.
1 Zone Marker
This function is disclosed in Japanese Patent Application, "Spectrum Analyzer" (Published Unexamined Japanese Patent Application No. 63-218869) by the same applicant (some common inventors) as the present invention. More specifically, in the zone marker function, in order to facilitate observation of a peak (dip) of a spectrum within a desired frequency range displayed on a display device, a desired frequency range in a measurement frequency region is set as a zone, the zone can be horizontally moved in the measurement frequency region, the zone width is also variable, and a peak (the top of a mountain) or a dip (the deepest bottom of a valley) is indicated by a marker. (See FIG. 25)
Thereafter, the same technique was disclosed as a U.S. Patent (U.S. Pat. No. 4,901,873).
2 Zone Sweep (Partial Sweep)
This function is disclosed in Japanese Patent Application, "Spectrum Analyzer" (Published Unexamined Japanese Patent Application No. 64-9371) by the same applicant (some common inventors) as the present invention. More specifically, in order to allow high-speed observation while maintaining original performance and functions of a spectrum analyzer, a signal is ana
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Iiyoshi Katsuhisa
Kamiyama Katsuhiko
Katayama Aiichi
Kawauchi Takehiko
Anritsu Corporation
Jankus Almis
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