Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Patent
1991-01-22
1991-12-24
Wieder, Kenneth A.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
324 77R, 324 78R, 324638, 324650, 324121R, 364485, 340723, G01R 1320, H01J 2970
Patent
active
050756184
ABSTRACT:
Display section displays, on a screen, a zone marker for indicating, on a wide-band spectrum display area, that part of a wide-band spectrum which corresponds to a selected narrow-band spectrum to be displayed, and the wide-band spectrum, as well as said narrow-band spectrum which has been enlarged. First setting section changes a center frequency or a band width of said displayed narrow-band spectrum, in accordance with the change of the position or width of the zone marker. Second setting section cooperating with the first setting section changes the position or width of the zone marker in accordance with the movement of the center frequency or band width of the displayed narrow-band spectrum. Control section for controlling a measurement resolution and a sweep time in accordance with the magnitude of the displayed spectrum, so as to satisfy the formula:
REFERENCES:
patent: 4264958 (1981-04-01), Rowell, Jr. et al.
patent: 4801873 (1989-01-01), Takano
patent: 4839583 (1989-06-01), Takano et al.
patent: 4975636 (1990-12-01), Desautels
Hale: "A Low-Freq. Spectrum Analyzer That Makes Slow Sweeps Practical", HP Journal, Sep. 1973.
Evel, "Digital Wavefrom Storage for the Oscilloscope Measurement System", HP Journal, Sep. 1982.
Anritsu Corporation
Solis Jose M.
Wieder Kenneth A.
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