Wave surface characterization

Details Wave surface characterization Wave surface characterization

1988-02-26

1988-08-02

Buczinski, Stephen C.

Optics: measuring and testing

Angle measuring or angular axial alignment

With photodetection remote from measured angle

73304C, 250574, 340603, 340619, 340620, 356 1, 356 2, 358 96, 358107, G01C 100, G01F 2300, G08B 2100

Patent

active

H00005037

ABSTRACT:
A method of obtaining data for mathematical characterization of a wave surface by transmitting a beam toward the surface so that the beam is reflected from an element of the surface in a direction determined by the instantaneous, two dimensional slope of the element. The reflected beam impinges on a screen as a spot whose time varying coordinates correspond to the time varying slope of the element. These coordinates are captured by scanning the screen with a raster scan which controls counters identifying the spot position. The instantaneous distance is measured by a capacitance probe to relate the captured coordinates to the corresponding angles of reflection by appropriate trigonometric relations.

REFERENCES:
patent: 3603952 (1971-09-01), Smith
patent: 4277167 (1981-07-01), Eppel
patent: 4512183 (1985-04-01), Alexander
patent: 4521118 (1985-06-01), Rosencwaig
patent: 4579463 (1986-04-01), Rosencwaig et al.
IEEE Transaction on Geoscience Electronics; vol. GE-7, No. 4, Oct. 1969, : NCN 68657.

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