Wave formatter for a logic circuit testing system

Details Wave formatter for a logic circuit testing system Wave formatter for a logic circuit testing system

1985-12-03

1988-07-05

Miller, Stanley D.

Electrical pulse counters, pulse dividers, or shift registers: c

Counting or dividing in incremental steps

Beam type tube

328 72, 328119, 377 78, H03K 117, H03K 700, H03K 1700

Patent

active

047557583

ABSTRACT:
A wave formatter for generating an output waveform used in a logic circuit testing system is disclosd. The wave formatter includes a data generator for outputting in parallel a plurality of data signals having a polarity and a type in response to a control signal for determining the polarity of the data signals and a control data signal for determining the type of the data signals which are received on external input lines of the data generator in synchronism with a test cycle clock. The data generator decodes the control data signals to produce the plurality of data signals in parallel. A shift data supply is provided which receives the plurality of data signals from the data generator and samples the plurality of data signals to output in parallel data signals in response to the test cycle clock. A timing control is provided with external lines for receiving clock input signals and which generate a signal for controlling an operation mode of a shift register on the basis of the clock input signals which are externally supplied to the external lines. A shift register receives the data in parallel with the shift data supply and the signal for controlling an operation mode and outputs the output waveform serially as a function of the signal for controlling an operation mode.

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