X-ray or gamma ray systems or devices – Source
Patent
1995-01-13
1996-11-19
Porta, David P.
X-ray or gamma ray systems or devices
Source
378143, H05G 200
Patent
active
055770916
ABSTRACT:
A high repetition-rate laser plasma target source system wherein ice crystals are irradiated by a laser and lithography system. The target source system comprises in a preferred embodiment a liquid tank source and freezer means which freezes microscopic particles into crystal shapes which are projected by a nozzle jet from a high repetition rate liquid-droplet injector into the path of a flashing laser beam, which results in producing soft x-rays of approximately 11.7 nm and 13 nm. Uncollected and unshot target crystals are collected and reliquified by a heater source in order to be recycled back to the liquid tank source. Optionally an auxiliary source and detector system can be used to allow for instantaneous triggering of the laser beam. The target source system can be incorporated into well known EUV lithography systems for the production of wafer chips.
REFERENCES:
patent: 4700371 (1987-10-01), Forsyth et al.
patent: 4723262 (1988-02-01), Noda et al.
patent: 4866517 (1989-09-01), Mochizuki et al.
patent: 5126755 (1992-06-01), Sharpe et al.
patent: 5142297 (1992-08-01), Eijkman et al.
patent: 5151928 (1992-09-01), Hirose
patent: 5459771 (1995-10-01), Richardson et al.
Mochizuki et al., Soft X-ray Optics & Tech., Proccedings of SPIE vol. 733, Dec. 1986, pp. 23-27.
Silfvast et al. Laser-produced plasma for soft s-ray projection lithography, J. Vac. Sci. Technol. Nov. 1992, pp. 3126-3133.
Richardson et al. Laser plasma sources for soft x-ray projection lithography, SPIE vol. 1848, Nov. 1992, pp. 483-500.
Jine et al., Mass limited laser plasma cryogenic target for 23nm point x-ray sources for lithography, SPIE vol. 2015, Aug. 1993, pp. 1-9.
Richardson et al., Characterization and control of laser plasma flux parameters for soft-x-ray projection lithography, Applied Optics vol. 32, No. 34, Dec. 1993, pp. 6901-6910.
Gabel Kai
Jin Feng
Kado Masataka
Richardson Martin
Bruce David Vernon
Porta David P.
Steinberger Brian S.
University of Central Florida
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