Warpage resistant semiconductor package and method for...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

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Details

C438S033000, C438S109000, C257SE21499, C257SE23064, C257SE23067, C257SE23085, C257SE23180, C257SE23190

Reexamination Certificate

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07989264

ABSTRACT:
A semiconductor package and a method for manufacturing the same is provided for minimizing or preventing warpage and twisting of semiconductor chip bodies as a result of thinning them during gringing. The semiconductor package includes a semiconductor chip body and a substrate. The semiconductor chip body has a first surface, a second surface facing away from the first surface, through-electrodes which pass through the semiconductor chip body and project from the second surface, and a warpage prevention part which projects in the shape of a fence along an edge of the second surface. The substrate has a substrate body and connection pads which are formed on an upper surface of the substrate body, facing the second surface, and which are connected with the projecting through-electrodes.

REFERENCES:
patent: 7588964 (2009-09-01), Kwon et al.
patent: 2006/0073637 (2006-04-01), Yokoyama et al.
patent: 2007/0210447 (2007-09-01), Kinsley
patent: 2008/0169545 (2008-07-01), Kwon et al.
patent: 1020020054476 (2002-07-01), None
patent: 1020030013737 (2003-02-01), None
patent: 10-0621438 (2006-08-01), None
patent: 1020070112645 (2007-11-01), None
USPTO Office Action mailed Feb. 17, 2010 for U.S. Appl. No. 12/044,420.
USPTO Notice of Allowance mailed Jun. 1, 2010 for U.S. Appl. No. 12/044,420.

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