Warp measurement device

Details Warp measurement device Warp measurement device

1992-11-17

1994-08-23

Cuchlinski, Jr., William A.

Geometrical instruments

Gauge

Straightness, flatness, or alignment

335554, 335612, G01B 520

Patent

active

053395344

ABSTRACT:
A device for measuring warpage of a surface is disclosed including a rigid support plate having first and second guide tracks attached thereto. A resiliently flexible band extends between the first and second guide tracks and includes first and second guides attached at ends of the band. A dial indicator is mounted to the rigid support plate for measuring deflection of the resiliently flexible band relative to the plate, wherein the dial indicator includes a probe attached to the flexible band for detecting deflection of the band relative to the plate. The flexible band resiliently deflects to conform to a warped surface when placed thereagainst, and the first and second guides reciprocate in the guide tracks as the band deflects to allow the band to conform to the warped surface. The band is of a predetermined length such that the dial indicator indicates deflection of the flexible band as a function of the predetermined length.

REFERENCES:
patent: 950285 (1910-02-01), Harper
patent: 1406117 (1922-02-01), Vrooman
patent: 2470697 (1949-05-01), Haederen

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